Your selections:
Measuring scattering distributions in scanning helium microscopy
- Hatchwell, C. J., Bergin, M., Carr, B., Barr, M. G., Fahy, A., Dastoor, P. C.
Standardizing resolution definition in scanning helium microscopy
- Bergin, M., Roland-Batty, W., Hatchwell, C. J., Myles, T. A., Martens, J., Fahy, A., Barr, M., Belcher, W. J., Dastoor, P. C.
Image formation in the scanning helium microscope
- Fahy, A., Eder, S. D., Barr, M., Martens, J., Myles, T. A., Dastoor, P. C.
Control of the higher eigenmodes of a microcantilever: applications in atomic force microscopy
- Karvinen, K. S., Moheimani, S. O. R.
Bridging the gap between conventional and video-speed scanning probe microscopes
- Fleming, A. J., Kenton, B. J., Leang, K. K.
Charge drives for scanning probe microscope positioning stages
- Fleming, A. J., Leang, K. K.
- Bosman, Michel, Keast, Vicki J.
Quantitative TEM-based phase retrieval of MgO nano-cubes using the transport of intensity equation
- Petersen, Tim C., Keast, Vicki J., Paganin, David M.
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